Atomic Force Miscrope (AFM) desgined for easy integration into the Scanning Electron Microscope (SEM)
![](https://www.nordicnano.se/wp-content/uploads/2021/01/litescope-homepage-2d4c1e7b1d3c6ff9502dc6dab7b320b5-1.png)
- Explore the capabilities of true correlative microscopy.
- Merge the forces of SEM and AFM .
For more information please visit NenoVisions website
Atomic Force Miscrope (AFM) desgined for easy integration into the Scanning Electron Microscope (SEM)
For more information please visit NenoVisions website